Semiconductor Engineering

Testing The Stack: DFT Is Ready For 3D Devices

When existing advanced 2D designs already push the limits of design-for-test (DFT) tools, what hope do developers have of managing DFT for 3D devices? Can anyone afford the tool run time, on-chip area ...
EDN

How to generate test patterns to detect FinFET defects

The size and performance advantages of FinFETs are leading to a general industry adoption of these 3D transistors at the more advanced technology nodes. These complex transistors, however, exacerbate ...
AOL

Faster 3D Printing Could Be A Simple Pattern Away

As impressive as the 3D printing process is, it can also be a bit time consuming. You are creating something out of nothing after all, and your printer needs to dispense and layer every square inch of ...
EDN

Imec Teams With Cadence to Present Automated Design-for-Test (DFT) Solution for 3D Memory-on-Logic

Leuven, Belgium, January 22, 2013 – At the European 3D TSV Summit in Grenoble, France on January 22-23, 2013, imec, a world-leading nano-electronics research institute, today announced that together ...
Hackaday

test pattern

[Nicholas Murray]’s Composite Test Pattern Generator is a beautifully-made, palm-sized tool that uses an ESP32-based development board to output different test patterns in PAL/NTSC. If one is checking ...