Increased productivity and efficiency with one-pass test enabled by a high-voltage switching matrix Designed to enhance the safety of operators and equipment; complies with regulations SANTA ROSA, ...
Aehr Test Systems (NASDAQ:AEHR) advanced 11% after announcing a follow-on production order for one of its FOX-XP wafer-level ...
FREMONT, CA / ACCESS Newswire / February 28, 2025 / Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced it has completed shipment of its ...
In-field testing is essential for quickly detecting emerging defects throughout a device's operational lifespan.
Modern technology depends on precision at a level that would have seemed unimaginable only a few decades ago. Every ...
FREMONT, CA / ACCESS Newswire / June 17, 2026 / Aehr Test Systems (NASDAQ:AEHR), a leading provider of test and burn-in solutions for semiconductor devices used in artificial intelligence (AI), ...
Aehr Test Systems has recently attracted heightened attention as management showcases its wafer-level test and burn-in solutions for AI processors, silicon carbide, gallium nitride, and silicon ...
A new technical paper titled “Design and Implementation of Test Infrastructure for Higher Parallel Wafer Level Testing of System-on-Chip” was published by researchers at Inha University and Teradyne. ...
Aehr Test Systems (AEHR) shares experienced a sharp upward move driven by the announcement of a new production order, ...
TOKYO, Sept. 10, 2024 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) will feature its leading-edge IC test solutions at the first-ever SEMICON ...
Melexis, a Belgium-based microelectronics solutions provider, recently announced the opening of its largest wafer testing plant in Kuching, Sarawak, East Malaysia. The new facility, valued at EUR 70 ...
High-throughput and non-destructive electroluminescence detection of microscale light-emitting diodes can be performed using flexible probe arrays that adaptively deform to match the surface ...
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